Microstresses in textured polycrystals studied by the multireflection diffraction method and self-consistent model

Abstract

A new version of the X-ray diffraction method for determining macrostresses and microstresses in textured polycrystalline material is presented. In this method the lattice strains for various orientation of the scattering vector as well as for various crystallographic planes {hkl} are measured. The interpretation of the experimental data is based on the least-squares fitting procedure, in which the diffraction elastic constants and theoretical values of microstresses are used. The diffraction elastic constants and the microstresses are calculated by the self-consistent model. The new method was successfully applied for stress determination in one- and two-phase steels subjected to elastoplastic deformation, and the significant anisotropy of the incompatibility stresses was observed in textured samples.

Acknowledgements

This work has been partially supported by the Konutet Badan Naukowych and by the Polish–French Integrated Programme POLONIUM 2001–2003.

Notes

†All quantities defined with respect to the L frame (figure 1) are denoted by a prime to distinguish them from those defined in the S system.

ast; can be assumed to be equal to zero for X-ray diffraction and a single-phase material.