Identification of slip systems in CaWO₄ scheelite

Abstract

Slip systems in indented natural single crystal scheelite were studied using TEM. Indentations with loads from 10 to 200 g were applied on (001), (100), (110), and (112) crystallographic planes at room temperature. Focused Ion Beam (FIB) technique was used to machine electron-transparent foils with pre-defined orientations from specific locations in and around the indented areas. Five families of slip systems with a total of 16 physically different slip systems were observed. Most plastic deformation was carried out by two major slip systems, (001)⟨110⟩ and {112}⟨11

⟩. The observations are interpreted using the crystallographic structure of scheelite.

Acknowledgements

This work was supported by the Air Force Research Laboratory (AFRL), Materials and Manufacturing Directorate, under Contract No. F33615-01-C-5214. It was performed at AFRL's Materials Characterization Facility operated by UES Inc., under AF contract F33615-03-C-5206, and the help of its staff is greatly appreciated. Special thanks go to Dr. Robert Wheeler and Mr. Scott Apt (UES Inc.) who taught the author the art and magic of FIB. Many useful discussions with Dr. Randall Hay (AFRL) and Dr. Triplicane Parthasarathy (UES, Inc.) greatly contributed to this work. The author also wishes to thank Mr. Marlin Cook (UES, Inc.) who prepared the specimens and carefully conducted all indentation experiments.

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P. Mogilevsky *

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