Yttrium segregation and intergranular defects in alumina

Abstract

Intergranular segregation of yttrium is investigated in a rhombohedral twin grain boundary of alumina. The deviation from the twin orientation is compensated by a periodic arrangement of intergranular dislocations. TEM tools (CTEM and HREM, EDXS, EFTEM and EELS/ELNES) have been used to characterize changes in chemical and electronic environments along this twin. Within the experimental limits, no Y is detected in the perfect twin parts. On the other hand, Y segregation occurs very locally in the dislocation cores on about four atomic planes perpendicularly to the GB, which in fact corresponds to the step height associated with the interfacial dislocations. By comparison with an undoped bicrystal, both the dislocation distribution and the Y segregation localization confirm the influence of Y on the dislocation mobility. Furthermore, in the Y-rich defects, high spatial resolution analysis of the energy loss near edge structures (ELNES) of the Al-L₂₃ absorption edge brings some enlightenments about the Al³⁺ cation environment, provided the effects of local radiation damage are fully considered and under control.

Acknowledgements

E.A. Stepantsov and A.L. Vasiliev from the Institute of Crystallography of Moscow are gratefully acknowledged for the preparation of the bicrystals. We are pleased to thank C. Colliex for careful and rewarding reading of the manuscript.