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Abstract
The microstructures of beech wood and of beech wood-derived carbon, silicon carbide (SiC), and an aluminum/SiC composite were studied using both scanning electron microscopy (SEM) and synchrotron X-ray micro-computed tomography (µCT). As opposed to traditional two-dimensional imaging techniques, the µCT data allowed nondestructive evaluation of relatively large sample volumes. Nondestructive three-dimensional data analysis led to the observation of microstructural features, such as varying pore-wall topographies not previously seen in SEM, calculations of the volume fraction of porosity and characterization of the interconnectivity of porosity in the SiC material.
Acknowledgements
Funding for this work was provided by National Science Foundation Grant DMR-0710630. Use of the Advanced Photon Source at Argonne National Laboratory was supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
