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Part A: Materials Science

Electrical contact resistance and dynamic contact stiffness for a cluster of microcontacts: cross-property connection in the low-frequency range

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Pages 1764-1776 | Received 26 Feb 2011, Accepted 23 Jan 2012, Published online: 09 Mar 2012
 

Abstract

An explicit cross-property connection for a rough interface between the electrical contact resistance and dynamic contact stiffness has been established in the low-frequency limit. The present analysis is based on the first-order asymptotic model of multiple dynamic contact between small flat-ended indenters on an elastic half-space, which is a dynamic analogue of the quasi-static Greenwood model. The obtained results can be used in developing a vibration method for measuring the interface contact stiffness in tribological systems, and in estimating the surface-roughness effect in oscillation indentation tests.

Acknowledgements

Partial financial support from the Russian Foundation for Basic Research (project No. 10-08-00966-a) is gratefully acknowledged. This paper was completed during the Marie Curie Fellowship of Dr. I.I. Argatov at the University of Aberystwyth, supported by the European Union Seventh Framework Programme under contract number PIIF-GA-2009-253055. The authors would also like to express their gratitude to the referees for their helpful comments and discussions.

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