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Original Articles

Single-crystal growth of YbRh2Si2 and YbIr2Si2

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Pages 2508-2523 | Received 02 Dec 2011, Accepted 07 Feb 2012, Published online: 02 Apr 2012
 

Abstract

We report on the single-crystal growth of the heavy-fermion compounds YbRh2Si2 and YbIr2Si2 using a high-temperature indium-flux technique. The optimization of the initial composition and the temperature–time profile lead to large (up to 100 mg) and clean (ρ0 ≈ 0.5 µΩ cm) single crystals of YbRh2Si2. Low-temperature resistivity measurements revealed a sample-dependent temperature exponent below 10 K, which for the samples with highest quality deviates from a linear-in-T behaviour. Furthermore, we grew single crystals of the alloy series Yb(Rh1−x Ir x )2Si2 with 0 ≤ x ≤ 0.23 and report the structural details. For pure YbIr2Si2, we establish the formation of two crystallographic modifications, where the magnetic 4f electrons have different physical ground states.

Acknowledgements

The authors thank U. Burkhardt and P. Scheppan for energy dispersive X-ray analysis of the samples as well as N. Caroca-Canales and R. Weise for technical assistance. The presented low-temperature susceptibility measurements were performed with the help of C. Klausnitzer. We acknowledge valuable discussions with M. Brando, M. Deppe, J. Ferstl, S. Friedemann, P. Gegenwart, A. Rosch, and F. Steglich. The DFG (Research Unit 960, ‘Quantum phase transitions’) is acknowledged for financial support.

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