The modification of the characteristics of nanocrystalline ZnO thin films by variation of Ta doping content

Abstract

Thin films of Ta-doped ZnO were synthesised via sol–gel spin coating route. The structural and optical properties of the films were evaluated to find out the effect of Ta dopant content. X-ray diffraction results indicated that all samples have hexagonal wurtzite crystal structure with polycrystalline nature. (0 0 2) peak is the most intense peak observed in all samples as well as the highest textured coefficient. Standard deviation results have shown that the kind of nucleation varies from heterogeneous to homogenous with Ta doping content. Additionally, Ta-incorporated ZnO films revealed not only a decreased surface roughness, but also an increased optical transmittance. Direct optical band gap values increased from 3.14 to 3.28 eV, and Urbach energy values decreased from 217 to 147 meV with increasing Ta doping. Refractive index and dielectric constant values were determined by means of two different functions and a significant consistency was found among them. Moreover, the correlation between the optical and structural properties showed that there is a relationship between refractive index and lattice constants of Ta-doped ZnO films.

Keywords:

• ZnO
• thin films
• Sol–gel route
• impurities