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Abstract
The widths of the Fermi edges of the MgL22 x-ray emission bands from some Mg-Cd alloys have been measured. The data are analysed to allow for instrumental broadening and spectral overlap. It is shown that as the cadmium concentration is increased from 0 to 25 at. % the edge width increases by about 0·1 ev and that on ordering the Mg3Cd edge width decreases by about 0·03 ev. These changes appear to correlate closely with resistivity measurements.