Field-ion and electron microscopy of grain-boundary structure

Abstract

The significance of field-ion studies of high angle grain-boundary structure is reconsidered in the light of the limitations of resolution and crystallographic accuracy inherent in the technique. All available data for high angle boundaries are compared with the predictions of the coincident site lattice model which is shown not to apply to the majority of observations. One boundary is analysed in detail to show how facets, ledges and grain-boundary dislocations are recognized. Combined electron and field-ion microscopy are used to investigate the nature of grain-boundary dislocations.