Non-crystalline to crystalline transformation in zinc, cadmium and tin

Abstract

Very thin layers of zinc, cadmium and tin have been deposited on polished copper and on insulating substrates at low temperatures. The films show diffuse rings when examined by reflection electron diffraction at low temperatures and, on annealing, crystallize, exhibiting the normal diffraction pattern associated with the materials. Measurement of the resistance of these layers indicates an irreversible change in resistance on annealing concomitant with the diffraction change. The temperatures at which crystallization takes place have been determined.