11
Views
9
CrossRef citations to date
0
Altmetric
Original Articles

Many-beam contrast effects of dislocations

&
Pages 177-188 | Received 03 May 1971, Published online: 02 Sep 2006
 

Abstract

The method of computation of electron microscope images of dislocations developed by Head (1967) for the two-beam case is extended to the many-beam case of electron diffraction. For 100 kv microscopy the application of such computations will consist primarily of taking into account higher systematic reflections but the good agreement that was obtained in some non-systematic many-beam cases serves to prove the quality of the method and in high-voltage microscopy many-beam computations will become indispensable. The contrast of pure screw dislocations in α-iron was investigated for some specific three-beam cases at 100 kv and a reasonable agreement between experimental and theoretical micrographs was obtained.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.