![Sample our Physical Sciences journals, sign in here to start your FREE access for 14 days]({"type":"image" , "src" : "/sda/110819/TOC-Subject-Sample-2021-Physical-Sciences.jpg"})
It is shown that the angular distribution of back-scattered electrons can be observed in a scanning electron microscope, and that the patterns observed can be used to obtain crystallographic information about the specimen. The patterns are termed electron back-scattering patterns (E.B.S.P.). The use of these patterns as a crystallographic techniques is shown to have several significant advantages over two other techniques currently in use in scanning electron microscopes.
Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?
To request a reprint or corporate permissions for this article, please click on the relevant link below:
Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?
Obtain permissions instantly via Rightslink by clicking on the button below:
If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.
