16
Views
3
CrossRef citations to date
0
Altmetric
Original Articles

Effect of charged-centre scattering on the mobility of photo-excited carriers in defect photoconductors

&
Pages 121-126 | Received 22 Jul 1972, Published online: 20 Aug 2006
 

Abstract

The application of light to a photoconductor results in a considerable change in the concentration of charged traps in its band gap, the change being a strong-function of light intensity and temperature. The effect of these carrier-scattering centres on the mobility causes it to be proportional to the free-carrier lifetimes at low temperatures, which is also a strong function of light intensity and temperature. The free carrier lifetimes and hence the mobility increase with increasing temperature. Since, at sufficiently high temperatures, the mobility is controlled by impurity scattering, which causes the mobility to decrease with increasing temperature, the mobility exhibits a maximum. The magnitude of the maximum and the temperature at which it occurs is a function of the light intensity and trap density.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.