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Correspondence

Substitutional doping in amorphous semiconductors the As-Si system

Pages 663-667 | Received 03 Jun 1976, Published online: 20 Aug 2006
 

Abstract

The amorphous alloy system As-Si has been prepared in thin film form using the plasma decomposition of silane-arsine mixtures. Electrical and optical measurements show effects characteristic of substitutional impurity doping for low concentrations of arsenic. A transition from impurity doping to alloy behaviour is observed with increasing arsenic concentration. Similar behaviour is not observed for low concentrations of silicon in arsenic.

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