General extinction criteria in multi-beam electron microscopy for interfaces in homogeneous crystals

Abstract

General criteria for interface extinction in homogeneous crystals are obtained under multi-beam diffraction conditions. They depend on the nature and the location (with respect to the elements of symmetry (h_i|t_i) of the structure) of the operator (R|τ) characterizing the defect. New information may then be obtained for the location of atoms on both sides of the boundary.