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Original Articles

Electron‐Induced Puncturing of Endohedral Metallofullerenes

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Pages 261-267 | Published online: 22 Aug 2006
 

Abstract

We demonstrate here the atomic‐level detection of the associated migration of individual atoms, occurring in carbon nano‐peapods by high‐resolution transmission electron microscopy (HR‐TEM). Through the atomic defects induced at the fullerene cage, the encapsulated individual metal atoms (Tb and Gd) are transferred from cage to cage through an induced atomic path within a carbon nano‐peapod. The present results indicate the possibilities for a method to convey single‐atoms by using an “atomic carry‐bag” such as fullerenes.

Acknowledgments

The work in electron microscopy was supported by the NEDO Nano‐carbon Technology project under the guidance of Prof. Sumio Iijima. We are grateful to Professor Hisanori Shinohara and his associates for providing the specimens examined here.

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