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I thank M. Wilson and K. Draney for the opportunity to present the critical views outlined in this note to the audience of Measurement, as well as for their valuable comments on an earlier draft that contributed substantially to its improvement. I am also grateful to M. Kolen, R. Brennan, M. Reckase, and M. Duong for valuable discussions on test equating, as well as to B. Muthén, G. A. Marcoulides, and T. Brown for insightful comments on measurement invariance.
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