ABSTRACT
Tantalum nanoparticles (Ta NPs) were prepared in an ethylene glycol (EG) solution by ablation with a 1064 nm Nd:YAG operating at 10 Hz. Fabricated NPs were characterized by UV-visible absorption spectroscopy, Transmission electron microscopy, Scanning electron microscopy, X-ray diffraction, Raman spectroscopy, and Fourier transform infrared spectroscopy. The average sizes of the NPs were estimated to be in the 14–19 nm range. From the UV-visible studies, the plasmon peak position of the Ta NPs was observed in the spectral range of 213–222 nm. The crystalline nature and phase structure of the Ta NPs were investigated using selected area electron diffraction and X-ray diffraction. Furthermore, for the detection and identification of molecular species absorbed at NPs surface, Raman spectroscopy and Fourier transform infrared spectroscopy analyses were performed.