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Molecular Crystals and Liquid Crystals Volume 413, 2004 - Issue 1: Proceedings of the 19th INTERNATIONAL LIQUID CRYSTALS CONFERENCE
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SURFACES, CONFINED SYSTEMS, AND NANOSTRUCTURED SYSTEMS

INVESTIGATION OF REFRACTIVE INDICES OF FREE-STANDING FILMS BY ELLIPSOMETRY

Y. Okumoto Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-2188, Japan
,
M. Kimura Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-2188, Japan
,
T. Akahane Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-2188, Japan
,
N. Matsuhashi Department of Electrical Engineering, Hachinohe National College of Technology, Hachinohe, Aomori 039-1104, Japan
,
M. Yoshida Musashi Institute of Technology, Setagaya, Tokyo 158-8557, Japan
&
T. Tadokoro J. A. Woollam Japan Corp., Suginami, Tokyo 167-0051, Japan
Pages 91-98 | Published online: 07 Jan 2010
 
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Abstract

The refractive indices of free-standing films (FSFs) of an antiferroelectric liquid crystal MHPOBC and a conventional smectic liquid crystal 8CB were studied by means of transmission and reflection ellipsometry. When the FSF thickness of MHPOBC is thicker than 260 nm, the refractive indices of FSFs appear to be the same as those of bulk smectic layers. In the case of thin FSFs of 8CB with a small numbers of layers, birefringence could not be obtained clearly by means of reflection ellipsometry.

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