Abstract
Liquid crystal alignment on a-SiOx film surfaces through the ion beam exposure is studied. The pre-tilt angle of liquid crystals on a-SiOx film surfaces can be controlled from about 8° to about 89° by changing the ion beam incident angle from 25° to 80°. Vertical alignment of liquid crystal can be ascribed to high contact angles on ion-beam exposed inorganic film surfaces.
Notes
This work was partly supported by the Next-Generation Growth Engine Project of the Ministry of Commerce, Industry and Energy and the Second Phase BK21 Program of the Ministry of Education & Human Resources Development.