Measuring Thickness and Pretilt in Reflective Vertically Aligned Nematic Liquid Crystal Displays

Abstract

Pretilt angle is a parameter of the utmost importance in the ultimate performance of vertically-aligned negative nematic LC displays. When these devices work in reflective mode, as is the LCOS microdisplays, accurate measurement of pretilt angles becomes a difficult problem, since usual experimental setups based on retardation of the polarization components of the impinging light are proportional to the product effective birefringence (n _eff  − n _o ) times thickness, and any attempt to separate these variables is cancelled out by symmetry. This work shows a relatively simple method capable of separating both variables. An experimental setup specifically aimed at vertically aligned reflective cells has been prepared. At the same time, a simulation model has been developed taking into account the properties of actual reflective displays. Comparison between experimental and theoretical results shows some discrepancies that can be explained assuming that the LC profile contains a residual twist. Including that twist in the model, an excellent agreement between theory and experiment has been achieved. Matching of simulations and measurements yields to the separate determination of pretilt angle and thickness and gives good estimates for the residual twist angle.

Keywords:

• pretilt angle
• residual twist
• vertically aligned nematic