In Situ Real-Time X-Ray Diffraction During Thin Film Growth of Pentacene

Abstract

In situ and real-time observation of 2-dimensional grazing incidence x-ray diffraction (2D-GIXD) during growth of pentacene thin films were carried out using a newly home-built portable vacuum deposition chamber using synchrotron radiation at SPring-8. Crystal growth and successive polymorphic transformation from thin film phase to bulk phase are clearly observed at room temperature and 75°C. A distinct orientation of bulk phase characterized by tilted (001) plane is found in the grown thin films at room temperature.

Keywords:

• X-ray diffraction
• Thin film growth
• Organic semiconductor
• Structural analysis
• 2D-GIXD

Acknowledgments

The authors would like to thank Mamoru Kikuchi (Iwate Univ.) for his technical support on the measurement system. This synchrotron radiation experiments were performed at BL19B2 in SPring-8 with the approval of Japan synchrotron Radiation Research Institute (JASRI) (Proposal No. 2011A0036).