On Defects in Biaxial Nematic Films with Random Planar Surface Alignment: A Monte Carlo Study

Abstract

We present a detailed computer simulation study of the formation and evolution of topological defects in thin biaxial nematic films. We have used the Straley generalized Hamiltonian and a wide range of biaxial parameters to generate and explore a variety of mesophases. The differences obtained for the various cases are analyzed for thin biaxial nematic films with random planar (Schlieren) surface alignment.

Keywords:

• Computer simulation
• Monte Carlo
• biaxial nematics
• liquid crystals
• topological defects

Acknowledgements

This work was supported by the European Union Specific Targeted Research Projects (EU-STREP) Project “Biaxial Nematic Devices” (BIND) FP7-216025. CZ is grateful to the University of Bologna, while CC and PP thank the Istituto Nazionale di Fisica Nucleare (INFN) (grant I.S. BO62) for support.