Chemical modification to suppress metal ions elution of dental orthodontic wire surface

ABSTRACT

In this study, we investigated on suppression of metal ions elution on dental orthodontic wire. To suppress metal ion elution from stainless wire, two types of surface chemical modifications were carried out. The obtained wire were immersed into several aqueous solution then the eluted ions (Cr and Ni, which are well known to cause a metal allergy) were determined using coupled plasma mass spectrometry (ICP-MS). By both electropolymerization and self-assembly monolayer formation, the ion elution was effectively reduced. These results suggested that these surface modifications succeeded to suppress the metal ions.

KEYWORDS:

• Dental orthodontic wire
• electropolymerization
• monolayer
• self-assembly
• suppression of ion elution
• surface modification

Acknowledgement

A part of this work was conducted at “Joint-use Facilites: Laboratory of Analysis”, Hokkaido university, supported by “Nanotechnology Platform”. Program of the Ministry of Education, Culture, Sports and Technology (MEXT), Japan.

Additional information

Funding

One of the authors (S. A.) thanks the Japan Society for the Promotion of Science (JSPS) for financial support from Grant (Nos. 15K15716 and 17K11712).