105
Views
0
CrossRef citations to date
0
Altmetric
Research Article

An Investigation of Charging Effects by Different Factors on Carbon and Natural Bamboo Fibers in High-Resolution Scanning Electron Microscopic Imaging

ORCID Icon
 

ABSTRACT

Since the investigation of semi- or non-conductive fibers in a scanning electron microscope (SEM) is often a critical problem because of charging issues, this study attempted to find out conditions that may offer high-resolution images. Four factors: beam current, acceleration voltage, vacuum, and sample preparation, were varied to investigate carbon and natural bamboo fibers by minimizing the charging problem. Results indicated that, unlike carbon, natural bamboo fiber was poor in SEM investigation without coating either in environmental, low or high vacuum due to charge formation. However, investigation in a low vacuum below 5 kV was proven to be very effective of uncoated bamboo fiber.

摘要

由于在扫描电子显微镜(SEM)中对半导电或非导电纤维的研究往往是由于充电问题而引起的一个关键问题,因此本研究试图找出可能提供高分辨率图像的条件. 通过改变束流、加速电压、真空度和样品制备四个因素,研究碳纤维和天然竹纤维的充电问题. 结果表明,天然竹纤维与碳纤维不同,由于电荷的形成,在环境、低真空或高真空条件下,没有涂层,扫描电镜观察效果较差. 然而,在5kv以下的低真空条件下进行的研究证明,未涂覆竹纤维是非常有效的.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.