Transmission Electron Microscopy as Best Technique for Characterization in Nanotechnology

Abstract

The authors summarize the applications of transmission electron microscopy in the field of nanotechnology. Transmission electron microscopy (TEM) has represented as a very powerful instrument for studying and researching about the structure of nanomaterials in the material science world. The quantitative measures of particle size, grain size, size distribution, size homogeneity, lattice type, morphological information, crystallographic details, chemical composition of phases distribution, and parameters can obtain by transmission electron micrographs. So, TEM is the best technique for characterization of the nanomaterials such as nanoparticles and nanocomposites. Moreover, this study shows that electron diffraction pattern via the TEM is a perfect procedure for determining the structure of materials, including perfect crystals, defect structure, and phases. The study tries to show ability of TEM for characterization of nanomaterials.

Keywords:

• TEM
• nanoparticles
• characterization
• electron diffraction
• phases

Additional information

Funding

The authors would like to thank the TEM laboratory in Advanced Materials Group of Materials Research School (NSTRI) for its financial supports.