ABSTRACT
One of the challenges in the field of photovoltaics (PV) is the automation of defect detection in electroluminescent (EL) images of PV cells. This is due to the similarities between defects and the intricate nature of the background, which can make it difficult to accurately identify and distinguish defects. In response to this problem, we introduce the Efficient Long-Range Convolutional Network (ELCN) module, designed to enhance defect detection capabilities in EL images of PV cells. The ELCN module is based on the ConvNeXt block, renowned for its efficiency and scalability, and integrates the design principles of the Cross-Stage Partial Network (CSPNet). This unique design facilitates a higher level of gradient combination while simultaneously reducing computational overhead. By incorporating the ELCN into the YOLOv7 object detector, we create a novel end-to-end ELCN-YOLOv7 framework, improving accuracy and reducing model parameters for detecting defects in raw EL images. Furthermore, to boost the accuracy of ELCN-YOLOv7 even further, we propose a two-stage fine-tuning method. This approach leverages similar small datasets to assist in the fine-tuning process. On the PVEL-AD dataset, we validated the effectiveness of our proposed ELCN-YOLOv7 method. It achieved a 91.93% mAP and 94.34 FPS, representing improvements of 3.19% points in mAP and 16.82 in FPS over the baseline YOLOv7 model. Additionally, our method outperforms previous approaches in both speed and accuracy, thereby establishing a new state-of-the-art performance.
Disclosure statement
No potential conflict of interest was reported by the author(s).
Additional information
Notes on contributors
Huan Fu
Huan Fu is currently working toward the Graduate degree in Naval Architecture and Ocean Engineering with the College of Engineering Science and Technology, Shanghai Ocean University, Shanghai, China. He is currently interested in offshore photovoltaics, defect detection, and computer vision.
Guoqing Cheng
Guoqing Cheng received the Ph.D. degree in industry engineering from Tongji University, Shanghai, China, in 2018. He is currently an Associate Professor with the College of Engineering Science and Technology, Shanghai Ocean University, Shanghai, China. He has published in peer reviewed journals such as IEEE Transactions on Reliability, Reliability Engineering and System Safety, International Journal of Production Research, Applied Mathematical Modelling, etc. He is currently interested in reliability engineering and fault diagnosis.