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Original Articles

Lower Confidence Bound for Process-Yield Index S pk with Autocorrelated Process Data

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Pages 253-267 | Received 01 Oct 2013, Accepted 01 May 2014, Published online: 09 Feb 2016
 

Abstract

In this paper, the lower confidence bound for the process-yield index S pk is developed for autocorrelated process data. A simulation study is conducted to assess the performance of the proposed index and two existing indices C p and C pk for various combinations of sample size, autoregressive parameter, and true index value. The simulation results confirm that the estimated S pk performs better than the other two indices C p and C pk regarding bias and standard deviation. Additionally, the coverage rates of S pk in most cases are greater than a 95% lower limit of the stated nominal. Two real examples are used to demonstrate the application of the proposed approach.

Additional information

Notes on contributors

Fu-Kwun Wang

Fu-Kwun Wang is a Distinguished Professor in the Department of Industrial Management at the National Taiwan University of Science and Technology, Taiwan. His primary research interests are in reliability, quality and production management.

Yeneneh Tamirat

Yeneneh Tamirat is a Ph.D. candidate in the Department of Industrial Management at the National Taiwan University of Science and Technology, Taiwan. His research areas are statistical quality control and process capability analysis.

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