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Abstract
In this paper, the lower confidence bound for the process-yield index S pk is developed for autocorrelated process data. A simulation study is conducted to assess the performance of the proposed index and two existing indices C p and C pk for various combinations of sample size, autoregressive parameter, and true index value. The simulation results confirm that the estimated S pk performs better than the other two indices C p and C pk regarding bias and standard deviation. Additionally, the coverage rates of S pk in most cases are greater than a 95% lower limit of the stated nominal. Two real examples are used to demonstrate the application of the proposed approach.
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Notes on contributors
Fu-Kwun Wang
Fu-Kwun Wang is a Distinguished Professor in the Department of Industrial Management at the National Taiwan University of Science and Technology, Taiwan. His primary research interests are in reliability, quality and production management.
Yeneneh Tamirat
Yeneneh Tamirat is a Ph.D. candidate in the Department of Industrial Management at the National Taiwan University of Science and Technology, Taiwan. His research areas are statistical quality control and process capability analysis.