A Fast Implementation for the Typical Testor Property Identification Based on an Accumulative Binary Tuple

Abstract

In this paper, we introduce a fast implementation of the CT EXT algorithm for testor property identification, that is based on an accumulative binary tuple. The fast implementation of the CT EXT algorithm (one of the fastest algorithms reported), is designed to generate all the typical testors from a training matrix, requiring a reduced number of operations. Experimental results using this fast implementation and the comparison with other state-of-the-art algorithms that generate typical testors are presented.

Keywords:

• feature selection
• tipycal testors
• pattern recognition
• logical combinatorial pattern recognition