Precise Measurement of the Gamma-ray Emission Probabilities for ^116m In with Half-life of 54.15 min

Abstract

The γ-ray emission probabilities for ^116mIn with half-life of 54.15 min have been measured by a 4πβ(pc)-γ(HPGe) coincidence apparatus using a live-timed two-dimensional data acquisition system. Eleven γ-ray peaks of ^116mIn were recognised and the uncertainties of the measured emission probabilities for principal γ-rays were found to be less than 1%. On the other hand, the relative intensities for 18 energy γ-rays were determined with improved uncertainties by an ordinary γ-ray spectrometer. The decay parameters were determined with uncertainties of approximately 1%using these values and the evaluated values of weak γ-ray intensities and the internal conversion coefficients.

KEYWORDS:

• 4πβ counter
• high purity germanium detector
• coincidence counting techniques
• indium 116m
• disintegration rate
• absolute gamma-ray intensity
• gamma-ray emission probability
• relative gamma-ray intensity
• improved certainty
• decay parameter