ABSTRACT
ZnO films with and without Ti doping were deposited on the glass substrate by the spin coating method. Zn1-xTixO films have been investigated by the XRD, field emission scanning electron microscopy (FESEM), energy dispersive x- ray spectroscopy, UV-VIS spectroscopy and atomic force microscopy (AFM) analyses. FESEM images have shown that films surface morphology clearly altered with different Ti content. AFM measurements have shown that the root mean square roughness have increased from 6.18 nm to 12.3 nm by increasing Ti doping content. By increasing Ti concentration, the transparency of the ZnO films decreased while the optical band gap increased.
Acknowledgments
The authors gratefully acknowledge the support of this work by Shahid-Chamran University of Ahvaz.