Abstract
This paper deals with plane wave scattering and diffraction from a randomly rough strip using a combination of three tools: the perturbation method, the Wiener-Hopf technique and a group-theoretic consideration based on the shift-invariant property of the homogeneous random surface. The D a -Fourier transformation associated with the shift invariance is defined instead of the conventional complex Fourier transformation. For a slightly rough case, Wiener-Hopf equations for the zero-, first- and second-order perturbed fields are derived. They are reduced to a common Wiener-Hopf equation, an exact solution of which is obtained formally by means of the Wiener-Hopf technique. Using the inverse D a -Fourier transformation, the scattered wavefield is obtained as a stochastic field. When the strip width is large compared with the wavelength, a uniformly asymptotic representation of the scattered far field is obtained by the saddle point method. For a Gaussian roughness spectrum, several numerical results are calculated and illustrated in figures, based on which the characteristics of scattering and diffraction are discussed.
* Part of this paper was presented at the 1995 Progress in Electromagnetics Research Symposium [1].
Notes
* Part of this paper was presented at the 1995 Progress in Electromagnetics Research Symposium [1].