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Abstract
In this paper the relationship between the range-corrected far fields and the near field measurements is established. We propose methods to obtain far field quantities, including the bistatic RCS, bistatic range profiles, and bistatic images from near field measurements. We show how to obtain the Fourier space data in the Ewald sphere when the object is normally or obliquely illuminated and its scattered fields are received by a probe scanning over a planar aperture. We carry out a simulation of a near-field configuration and calculate near field data. From these data, we derive bistatic range profiles and reconstruct three-dimensional (3-D) bistatic images. We also implement a near-field measurement system and propose a calibration procedure so that the Fourier space data can be accurately obtained. A focused projective image has been reconstructed from near field data measured along one-dimensional scanning. Simulation and experimental results have verified the effectiveness of our algorithms.