A Study about a Method Joining the Admittance Matrix and the Data of Far Field

J. OuYang Department of Microwave Engineering, School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu 610054, P. R. China

F. Yang Department of Microwave Engineering, School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu 610054, P. R. China

S. W. Yang Department of Microwave Engineering, School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu 610054, P. R. China

Z. P. Nie Department of Microwave Engineering, School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu 610054, P. R. China

Z. Q. Zhi Department of Microwave Engineering, School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu 610054, P. R. China

Abstract

It is well known that the admittance matrix contains the effect of electromagnetic coupling between the active and passive elements of the array. And at the same time, the effect of electromagnetic coupling can also affects the far field of the array. Therefore in this paper, a novel method with rigorous demonstration, is present to join the relationships. This approach can be used to approximate the active patterns with admittance matrix, and also be used to calculate the admittance matrix with active patterns in different applications. For example, Approximating the active patterns through extrapolating or interpolating the admittance matrix, we can optimize the array pattern in sparse antennas array without full-wave analysis.

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A Study about a Method Joining the Admittance Matrix and the Data of Far Field

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A Study about a Method Joining the Admittance Matrix and the Data of Far Field

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