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Abstract
Capability in accurately determining the permittivity of a dielectric specimen is significant for a number of reasons. In this study, a new method is proposed to estimate the texture of the test rod with negligible error. It is based on the assumption that the specimen rod possesses electrically small dimensions, under which the scattering integral is simplified. The obtained formula is suitable for a variety of measuring configurations and has been tested for a particular one, with satisfying results.
