Electrostatic Field Analysis of Electrooptic Devices

Abstract

We describe a Finite Difference Method for the determination of the electrostatic field in a multilayered electrooptic device. The Laplace equation is solved, assuming a suitable closed area, by taking into account the different permittivities of the various layers. The effect of a higher permittivity in the guiding layer has been explicitly considered. As a practical example, we calculate the phase shift of a guided optical wave within an electrooptic modulator. A review of the various methods in use for the field analysis is given. Some criteria for the selection of the appropriate method are also mentioned.