One-Dimensional Target Profiling by Electromagnetic Backscattering

Abstract

This paper discusses methods and numerical simulations of one-dimensional profiling of targets in the direction of electromagnetic wave incidence. Two types of target materials are considered: a perfectly conducting material and a lossy dielectric of which the dielectric constant is assumed known a priori. The inversions for profile reconstructions for perfectly conducting bodies are based upon the modified extended physical optics method (EPO) for a perfectly conducting target. The modified extended physical optics method assumes the modified physical optics current properly over the entire surface of conducting scatterers. For dielectric scatterers having a known dielectric constant, the Rayleigh method is used for the inversion. The inversion is carried out by performing iteratively or singly the Fourier transformation of the backscattered field in the frequency domain. Numerical simulation results of the target profiling are shown for axially symmetric bodies with nose-on backscattering.