Abstract
Plating stress in nickel plating increases with high current density. A remedy for this has been demonstrated by using a step control method through combining plating at 20 A dm−2 (low current density) and 40 A dm−2 (high current density). Internal stress could be reduced in comparison to plating at a fixed current density by the initial formation of crystals at a 20 A dm−2 low current density, such that a state of low stress was maintained by epitaxial growth.
Acknowledgements
This work was aided by MEXT-supported Program for the Strategic Research Foundation at Private Universities.