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Abstract
A Nordlys F, fast electron backscatter diffraction camera has been used on a CamScan MX2500 field emission gun SEM in conjunction with a hot stage to study annealing phenomena in metals. The performance of the camera under a wide variety of conditions has been evaluated, and comparison is made with a conventional electron backscatter diffraction camera operating under the same conditions and with the same samples. Examples are given of applications of the system to the annealing of aluminium alloys.