135
Views
30
CrossRef citations to date
0
Altmetric
Articles

Preliminary studies using imaging mass spectrometry TOF-SIMS in detection and analysis of fingerprints

Pages 180-187 | Published online: 18 Jul 2013
 

Abstract

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is applied for the characterization and detection of fingerprints. In this case the possibility of surface imaging in various ions appears to be very interesting and useful. Experimental work was carried out using six types of surface (stainless steel, copper, brass, aluminium foil, glass, paper) on which fingerprints were placed. 'Natural' fingerprints and fingerprints polluted with Ni(NO3)2·6H2O, gunpowder residues and As2O3. were examined. The results suggest the possibility of relating the TOF-SIMS fingerprints to other evidence found at the crime scene, e.g. chemicals, beverages or gun shot residues discovered on the fingerprints.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.