Abstract
A new approach to creep, termed the θ-projection concept, is illustrated by reference to high-precision data obtained for polycrystalline copper. Over wide ranges of stress and temperature, the increase in creep strain εc with time t can be described precisely using the equation εc=θ1[1−exp(−θ2t]+θ3[exp(θ4t)−1] where θ1 and θ3 define the extent of the primary and tertiary stages with respect to strain and θ2 and θ4 quantify the curvatures of the primary and tertiary stages of creep respectively. Once the stress and temperature dependences of the four θ-parameters and the creep ductility are evaluated, the complex stress and temperature dependences of the minimum creep rate and the rupture life, as well as the exact form of the deformation mechanism map expected for polycrystalline copper, can be predicted directly without invoking any change in creep mechanism.
MST/504