Abstract
Results obtained for the first time using Ga2S3 and Ga2Se3 compounds as sources of donor elements for the molecular beam epitaxy of AlxGa1−xSb (0≤x≤1) and AlxGa1−x As (0≤x≤0·4) are reported. In GaAs, free electron concentrations obtained when incorporating the donors from these sources can be readily controlled up to a maximum of 5 × 1018 cm −3. For AxGa1−xSb it was possible to compensate the high concentration of native acceptors and obtain n type conductivity over the full composition range of the alloy. In AxGa1−xSb donor related defects (DX centres) were observed.
MST/3331