High-Resolution Transmission Measurements of ²³³U Using a Cooled Sample at the Temperature T = 11 K

K. H. GuberOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

R. R. SpencerOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

L. C. LealOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

P. E. KoehlerOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

J. A. HarveyOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

R. O. SayerOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

H. DerrienOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

T. E. ValentineOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

D. E. PierceOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

V. M. CauleyOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

T. A. LewisOak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37921-6354

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Abstract

For the first time, high-resolution transmission data of ²³³U have been obtained using a cooled sample. The samples were cooled to T = 11 K using a cryogenic device, which reduced the Doppler broadening of resonances by 50% compared to room-temperature measurements. The measurements were carried out at the Oak Ridge Electron Linear Accelerator over the energy range from 0.6 eV to 300 keV at the 80-m flight path station. Corrections were made for experimental effects, and the average total cross section in this energy range was determined. Results are compared to previous measurements.

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High-Resolution Transmission Measurements of ²³³U Using a Cooled Sample at the Temperature T = 11 K

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High-Resolution Transmission Measurements of 233U Using a Cooled Sample at the Temperature T = 11 K

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High-Resolution Transmission Measurements of ²³³U Using a Cooled Sample at the Temperature T = 11 K