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Original Articles

Microstructural analysis of oxide layer formation in ferritic stainless steel interconnects

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Pages 285-289 | Published online: 24 Oct 2014
 

Abstract

The oxide layer formation of ferritic stainless steel (Crofer22APU) oxidized in an air furnace at 800°C was analysed by transmission electron microscopy (TEM) and electron back scattered diffraction (EBSD).

EBSD analysis revealed that crystallographic orientation affects the oxidation behaviour of Crofer22APU. On {110} grains, most oxide granules had the same orientation but on {111} grains, they had random orientation.

TEM analysis revealed that the oxide layer consisted of spinel- chromia-spinel multi layered structure on the {110} matrix grain but no sub spinel oxide layer on the {111} matrix grain. On the {110} closed packed plane of matrix, the chromia oxide formation with the <110> direction of rhombohedral structure on the {001} closed packed plane parallels the <001> direction on the {110} plane of BCC matrix was observed, which is known as Pitsch-Schrader orientation relationship. On the {111} plane grain, there was no specific orientation relationship. Energy dispersive spectroscopy (EDS) analysis in TEM showed that an Mn rich region was developed on the {110} grain beneath chromia oxide and the conversion of this region to (Cr,Mn)3O4 spinel oxide layer causes multi layered oxide structures on the {110} matrix grain.

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