Analysis of Resonant Frequency for Electromagnetic Bandgap Structure Based on Phase Coherence

Abstract

A new method based on phase coherence for resonant frequency analysis of the electromagnetic bandgap (EBG) structure is proposed in this paper. Based on a simplified analysis model of reflected and transmitted waves, the resonant frequencies of reflection coefficient for two-unit cells are achieved through the phase of transmission coefficient for one-unit cell. For the purpose of method verification, a microstrip EBG structure is simulated and measured, which shows great consistence of resonant frequency between phase coherence method analysis and actual simulation/measurement. Since the proposed method explains the resonance of EBG structure from the interference of electromagnetic waves level, it has a clear physical meaning. Moreover, it may provide a convenient way for the characteristic analysis of EBG structure.

Keywords:

• Electromagnetic bandgap
• Interference
• Microstrip
• Phase coherence
• Resonant frequency

Additional information

Notes on contributors

Jun Wang

Jun Wang was born in Anhui, China. He received the B.E. degree in electronic and information engineering from Anhui University. He is currently working towards the Ph.D. degree in electronic engineering at Beihang University. His research interest includes the characterization and application of metamaterial. E-mail: [email protected]

Huansheng Ning

Huansheng Ning received the B.S. degree from Anhui University in 1996 and Ph.D. degree in Beihang University in 2001. Now he is an Associate Professor in School of Electronic and Information Engineering, Beihang University, China. His current research focuses on Internet of Things, aviation security, electromagnetic sensing and computing. He has published more than thirty papers in journals, international conferences/workshops, and four books. E-mail: [email protected]

Ling-Feng Mao

Ling-Feng Mao received the Ph. D degree in microelectronics and solid State Electronics from the Peking University, Beijing, P. R. China, in 2001. He is a professor in Soochow University. His research activities include modeling and characterization of semiconductor devices and circuits, the fabrication and modeling of integrated optic and microwave devices and circuits. E-mail: [email protected]