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The American Statistician Volume 43, 1989 - Issue 2
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General

Statistics-Aided Manufacturing: A Look into the Future

Gerald J. Hahn Management Science and Statistics Program, General Electric Corporate Research and Development Center, Schenectady, NY, 12301, USA; Union College, USA
Pages 74-79 | Received 01 Aug 1988, Published online: 27 Feb 2012

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G. Rex Bryce. (2005) Developing Tomorrow's Statisticians. Journal of Statistics Education 13:1.
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Thomas R. Willemain & George C. Runger. (1998) Statistical process control using run sums. Journal of Statistical Computation and Simulation 61:4, pages 361-378.
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GEORGEC. RUNGER & THOMASR. WILLEMAIN. (1996) Batch-means control charts for autocorrelated data. IIE Transactions 28:6, pages 483-487.
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RussellR. Barton & DavidR. Gonzalez-Barreto. (1996) PROCESS-ORIENTED BASIS REPRESENTATIONS FOR MLTLTIVARIATE PROCESS DIAGNOSTICS. Quality Engineering 9:1, pages 107-118.
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George C. Runger & Thomas R. Willemain. (1995) Model-Based and Model-Free Control of Autocorrelated Processes. Journal of Quality Technology 27:4, pages 283-292.
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Thomas R. Williams & George C. Runger. (1994) Statistical process control using level crossings. Journal of Statistical Computation and Simulation 51:1, pages 7-20.
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RogerW. Hoerl, JeffreyH. Hooper, PeterJ. Jacobs & JamesM. Lucas. (1993) Skills for Industrial Statisticians to Survive and Prosper in the Emerging Quality Environment. The American Statistician 47:4, pages 280-292.
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MichaelA. Wincek. (1990) Applied Statistical Time Series Analysis. Technometrics 32:3, pages 353-354.
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GeraldJ. Hahn. (1990) Commentary. Technometrics 32:3, pages 257-258.
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JohnF. MacGregor & ThomasJ. Harris. (1990) Discussion. Technometrics 32:1, pages 23-26.
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Articles from other publishers (1)

Christina M. Mastrangelo, Joseph M. Porter & Robert V. BaxleyJr.Jr.. 2001. Frontiers in Statistical Quality Control 6. Frontiers in Statistical Quality Control 6 228 246 .

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