Structural properties and effect of excess pb on pb(zr_0.52ti_0.48)o₃ thin films prepared by sol-gel processing

Dong-Soo Paik Department of Electrical Engineering, Yonsei University, Shinchon-dong, Seodaemun-ku, 120-749, Seoul, Korea

Joon-Han Kim Department of Electrical Engineering, Yonsei University, Shinchon-dong, Seodaemun-ku, 120-749, Seoul, Korea

Hyung-Wook Choi Department of Electrical Engineering, Yonsei University, Shinchon-dong, Seodaemun-ku, 120-749, Seoul, Korea

Hyun-Sang Yoon Department of Electrical Engineering, Yonsei University, Shinchon-dong, Seodaemun-ku, 120-749, Seoul, Korea

Chang-Yub Park Department of Electrical Engineering, Yonsei University, Shinchon-dong, Seodaemun-ku, 120-749, Seoul, Korea

Hyun-Yong Shin Department of Electronic Engineering, Southern Seoul University, Cheonahn, Choongnam, 333-800, Korea

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Dong Soo Paik, A.V. Prasada Rao & S. Komarneni. (1998) Sol-gel fabrication of oriented PZT thin films: Effect of buffer layer in promoting epitaxial growth. Ferroelectrics 211:1, pages 141-151.
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Articles from other publishers (2)

S.B Mah, N.W Jang, J.H Park, D.S Paik & C.Y Park. (2000) Structural and electrical characteristics of (Pb1−xLax)(Zr0.5Ti0.5)O3 thin film capacitors. Materials Research Bulletin 35:7, pages 1113-1122.
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N.W Jang, S.B Mah, D.S Paik, H.W Choi & C.Y Park. (1999) Structural and electrical properties of PLZT films on ITO-coated glass prepared by a sol-gel process. Materials Research Bulletin 34:9, pages 1463-1472.
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Structural properties and effect of excess pb on pb(zr_0.52ti_0.48)o₃ thin films prepared by sol-gel processing

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Structural properties and effect of excess pb on pb(zr0.52ti0.48)o3 thin films prepared by sol-gel processing

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Structural properties and effect of excess pb on pb(zr_0.52ti_0.48)o₃ thin films prepared by sol-gel processing