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VIII. Electrical properties of thin films

Physical origin of conduction in PZT thin films

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Pages 147-154 | Received 23 Aug 1998, Accepted 10 Sep 1998, Published online: 09 Mar 2011

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I. Stolichnov, A. Tagantsev, N. Setter, S. Okhonin, P. Fazan, J.S. Cross, M. Tsukada, A. Bartic & D. Wouters. (2001) Constant-current study of dielectric breakdown of Pb(Zr,Ti)O3 ferroelectric film capacitors. Integrated Ferroelectrics 32:1-4, pages 45-54.
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Amador Pérez-Tomas, Haibing Xie, Zaiwei Wang, Hui-Seon Kim, Ian Shirley, Silver-Hamill Turren-Cruz, Anna Morales-Melgares, Benedicte Saliba, David Tanenbaum, Michael Saliba, Shaik Mohammed Zakeeruddin, Michael Gratzel, Anders Hagfeldt & Monica Lira-Cantu. (2019) PbZrTiO 3 ferroelectric oxide as an electron extraction material for stable halide perovskite solar cells . Sustainable Energy & Fuels 3:2, pages 382-389.
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. 2011. Ferroelectric Dielectrics Integrated on Silicon. Ferroelectric Dielectrics Integrated on Silicon 213 279 .
E.L. Colla, I. Stolichnov, A.K. Tagantsev & N. Setter. (2001) AFM polarization studies of high-fatigue-endurance PZT thin film capacitors with modified Pt/RuO/sub 2/ top electrodes. AFM polarization studies of high-fatigue-endurance PZT thin film capacitors with modified Pt/RuO/sub 2/ top electrodes.
I. Stolichnov, A. Tagantsev, N. Setter, J. S. Cross & M. Tsukada. (1999) Control of leakage conduction of high-fatigue-endurance (Pb, La)(Zr, Ti)O3 film ferroelectric capacitors with Pt/SrRuO3 electrodes. Applied Physics Letters 75:12, pages 1790-1792.
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