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Original Articles

Automated vision system for IC lead inspection

Pages 3353-3366 | Published online: 14 Nov 2010

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Read on this site (3)

Vaibhav Kumar, Jagdish Prasad & Baldev Singh. (2020) Traffic density estimation using progressive neural architecture search. Journal of Statistics and Management Systems 23:2, pages 481-493.
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K. Jenab & P. Ahi. (2010) Fuzzy quality feature monitoring model. International Journal of Production Research 48:17, pages 5021-5030.
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G. Byrne & C. Sheahan. (2005) Comparative analysis of vision systems for electroplating surface quality inspection. International Journal of Production Research 43:18, pages 3787-3801.
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Articles from other publishers (4)

Yongbing Zhou, Minghao Yuan, Jian Zhang, Guofu Ding & Shengfeng Qin. (2023) Review of vision-based defect detection research and its perspectives for printed circuit board. Journal of Manufacturing Systems 70, pages 557-578.
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Zhonghe Ren, Fengzhou Fang, Ning Yan & You Wu. (2021) State of the Art in Defect Detection Based on Machine Vision. International Journal of Precision Engineering and Manufacturing-Green Technology 9:2, pages 661-691.
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Qiusheng Zhong, Xianmin Zhang & Zhong Chen. (2016) Online coplanarity measurement of IC leads based on single camera vision system. Transactions of the Institute of Measurement and Control 38:11, pages 1365-1380.
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JrJung Lyu & MingNan Chen. (2009) Automated visual inspection expert system for multivariate statistical process control chart. Expert Systems with Applications 36:3, pages 5113-5118.
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