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Original Articles

SISO run-to-run feedback controller using triple EWMA smoothing for semiconductor manufacturing processes

Pages 3093-3120 | Published online: 14 Nov 2010

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Read on this site (15)

Sheng-Tsaing Tseng, Fugee Tsung & Jo-Hua Wu. (2019) Stability conditions and robustness analysis of a general MMSE run-to-run controller. IISE Transactions 51:11, pages 1279-1287.
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Sheng-Tsaing Tseng & Pei-Yu Chen. (2017) A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models. Technometrics 59:3, pages 381-390.
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Sheng-Tsaing Tseng, Hsin-Chao Mi & I.- Chen Lee. (2016) A Multivariate EWMA Controller for Linear Dynamic Processes. Technometrics 58:1, pages 104-115.
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Sheng-tsaing Tseng & Hsin-chao Mi. (2014) Quasi-minimum mean square error run-to-run controller for dynamic models. IIE Transactions 46:2, pages 185-196.
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Kaibo Wang & Jing Lin. (2013) A run-to-run control algorithm based on timely and delayed mixed-resolution information. International Journal of Production Research 51:15, pages 4704-4717.
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Chih-Hung Jen, Bernard C. Jiang & Chien-Chih Wang. (2011) Integration of run-to-run control schemes and on-line experiment to deal with the changes in semiconducting dynamic processes. International Journal of Production Research 49:19, pages 5657-5678.
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K. Jenab & P. Ahi. (2010) Fuzzy quality feature monitoring model. International Journal of Production Research 48:17, pages 5021-5030.
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Kaibo Wang & Fugee Tsung. (2010) Recursive parameter estimation for categorical process control. International Journal of Production Research 48:5, pages 1381-1394.
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Chih-Hung Jen & Bernard C. Jiang. (2008) Combining on-line experiment and process control methods for changes in a dynamic model. International Journal of Production Research 46:13, pages 3665-3682.
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S.-K. S. Fan & C.-Y. Wang. (2008) On-line tuning system of multivariate dEWMA control based on a neural network approach. International Journal of Production Research 46:13, pages 3459-3484.
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Kaibo Wang & Fugee Tsung. (2007) Monitoring feedback-controlled processes using adaptive 2 schemes. International Journal of Production Research 45:23, pages 5601-5619.
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Sheng-Tsaing Tseng, Fugee Tsung & Pei-Yun Liu. (2007) Variable EWMA run-to-run controller for drifted processes. IIE Transactions 39:3, pages 291-301.
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S.-K. S. Fan . (2005) Multiple-input single-output (MISO) ridge-optimizing quality controller for semiconductor manufacturing processes. International Journal of Production Research 43:22, pages 4745-4770.
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C.-H. Jen, B. C. Jiang & S.-K. S. Fan . (2004) General run-to-run (R2R) control framework using self-tuning control for multiple-input multiple-output (MIMO) processes. International Journal of Production Research 42:20, pages 4249-4270.
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C.-T. Su & C.-C. Hsu. (2004) On-line tuning of a single EWMA controller based on the neural technique. International Journal of Production Research 42:11, pages 2163-2178.
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Articles from other publishers (18)

Haiyan Wang, Tianhong Pan & Guochu Chen. (2023) Discrete Active Disturbance Rejection Control for Semiconductor Manufacturing Processes With Dynamic Models. IEEE Transactions on Semiconductor Manufacturing 36:4, pages 636-644.
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Sungil Yun, Matthew Tom, Feiyang Ou, Gerassimos Orkoulas & Panagiotis D. Christofides. (2022) Multivariable run-to-run control of thermal atomic layer etching of aluminum oxide thin films. Chemical Engineering Research and Design 182, pages 1-12.
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Sinyoung Kim, Jaeyeon Jang & Chang Ouk Kim. (2020) A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks. Journal of Intelligent Manufacturing 32:8, pages 2267-2280.
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Štefan Chamraz, Mikuláš Huba & Katarína Žáková. (2021) Stabilization of the Magnetic Levitation System. Applied Sciences 11:21, pages 10369.
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Weichin Chien & Lingyen Yeh. (2020) Optimization of Online Double Exponentially Weighted Moving Average Controller in a Multiple Inputs Single Output System. Optimization of Online Double Exponentially Weighted Moving Average Controller in a Multiple Inputs Single Output System.
Kai Liu, YangQuan Chen, Tao Zhang, Siyuan Tian & Xi Zhang. (2018) A survey of run-to-run control for batch processes. ISA Transactions 83, pages 107-125.
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Kai Liu, Yangquan Chen & Xi Zhang. (2017) An Application of the Seasonal Fractional ARIMA Model to the Semiconductor Manufacturing. IFAC-PapersOnLine 50:1, pages 8097-8102.
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Qingsong Gong, Genke Yang, Changchun Pan, Yuwang Chen & Moonsang Lee. (2017) Performance Analysis of Double EWMA Controller Under Dynamic Models With Drift. IEEE Transactions on Components, Packaging and Manufacturing Technology 7:5, pages 806-814.
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Joseph Sang-Il Kwon, Michael Nayhouse, Gerassimos Orkoulas, Dong Ni & Panagiotis D. Christofides. (2015) A method for handling batch-to-batch parametric drift using moving horizon estimation: Application to run-to-run MPC of batch crystallization. Chemical Engineering Science 127, pages 210-219.
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Jin Wang, Q. Peter He & Thomas F. Edgar. (2013) State Estimation for Integrated Moving Average Processes in High-Mix Semiconductor Manufacturing. Industrial & Engineering Chemistry Research 53:13, pages 5194-5204.
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Shu-Kai S. Fan, Le-Chun Lo, Yuan-Jung Chang, Chen-ju Lin & Fugee Tsung. (2012) Prediction of time-varying metrology delay for dEWMA and RLS-LT controllers. Journal of Process Control 22:4, pages 823-828.
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Chih-Hung Jen & Jia-Ming Wang. (2011) Integrating the Fault Detection Method and Run-to-Run Control for Improving Semiconductor Process Control. Procedia Computer Science 4, pages 1316-1325.
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Chih-Hung Jen, Kuo-Ping Lin, Wu Wen & Chang-Chien Chou. (2011) Using LDA with on-line experiment methods for coping with changes in MIMO dynamic model. Expert Systems with Applications 38:1, pages 983-989.
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Shu-Kai Fan & Yuan-Jung Chang. (2010) Recursive Least Squares Run-to-Run Control with Time-Varying Metrology Delays. Industrial Engineering and Management Systems 9:3, pages 262-274.
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JrJung Lyu & MingNan Chen. (2009) Automated visual inspection expert system for multivariate statistical process control chart. Expert Systems with Applications 36:3, pages 5113-5118.
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Shu-Kai S. Fan & Yen Lin. (2007) Multiple-input dual-output adjustment scheme for semiconductor manufacturing processes using a dynamic dual-response approach. European Journal of Operational Research 180:2, pages 868-884.
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Rajesh Ganesan, Tapas K. Das & Kandethody M. Ramachandran. (2007) A Multiresolution Analysis-Assisted Reinforcement Learning Approach to Run-by-Run Control. IEEE Transactions on Automation Science and Engineering 4:2, pages 182-193.
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Chao-Ton Su & Chun-Chin Hsu. (2004) A time-varying weights tuning method of the double EWMA controller. Omega 32:6, pages 473-480.
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